The NaMiFab core facility is a high-tech infrastructure for nano- and micro-fabrication technologies. Key processes involve the patterning of nanometer & micrometer-level thick films. Control over the thickness of these patterned structures is of crucial importance. Such measurements are carried out using a stylus profilometer, that scans a needle over the patterned structure to measure its height. Our current stylus profiler is end-of-life and is no longer supported by the company. Secondly, much of the research is scaling from samples to wafers (large industry-standard substrates). Therefore the new stylus profilometer should be able to handle these larger substrates as well.