Project

Near-field measurement techniques for the efficient solving EMC emission Problem

Acronym
NEATH
Duration
01 October 2012 → 30 September 2015
Funding
Regional and community funding: IWT/VLAIO
Promotor
Research disciplines
  • Engineering and technology
    • Electronics
Keywords
EMC emission
 
Project description

This project aims to develop, implement, test and demonstrate an industrially useful workflow based on various near-field measurement techniques to find the root cause of EMC emissions problem efficiently and cost-effectively solve. It will also examine and indicate how near-field techniques can be used to test prototypes early in the design process or (sub) modules and characterize to avoid later problems of EMC, signal and power integrity.