Smart*Light 2.0 takes the next step: the configuration of a reliable and optimized instrument for specific X-ray analysis techniques. The focus is on fluorescence, diffraction, scattering, spectroscopy and tomography. These allow the determination of elemental structure, atomic structure, nanostructure, chemical structure and 3D structure at sub-mm scale, respectively. All of these techniques are essential for understanding materials. An optimization step is needed for each for these X-ray analysis techniques in order to make the instrument as broad and sustainable as possible. Subsequent pilot activities with different materials such as metals, semiconductor technology, tissue and heritage will further optimize the instrument.

The goal is to have an instrument available at the end of the project period that can be used by the Dutch and Flemish research community and that can then be developed into a full-fledged research tool.