Type
Equipment
Acronym
Eclipse
Code
APP/00320
Date of commissioning
01 January 2014 → …
Research disciplines
-
Engineering and technology
- Semiconductor devices, nanoelectronics and technology
Keywords
optical inspection
high-resolution imaging
digital microscope
surface analysis
diascopic inspection
episcopic inspection
Brand Name/manufacturer
Nikon Eclipse LV100
Other information
Description
Microscopic inspection and image capturing / measuring of samples. Equipped with 15 X oculars for a standard magnification range of 75 X to 1500X, Nomarski prisms, and episcopic and diascopic filters.