Infrastructure

Optical profilometer - Wyko

Type
Equipment
Acronym
Wyko
Code
APP/00310
Date of commissioning
01 January 2008 → …
Research disciplines
  • Engineering and technology
    • Semiconductor devices, nanoelectronics and technology
Keywords
sub-nanometer resolution shape analysis white light interferometry surface mapping surface roughness
Brand Name/manufacturer
Veeco Wyko NT3300
Other information
 
Description

A white light interferometer is capable of mapping a several millimeter wide area in a single measurement, with sub-nanometer resolution, providing instantaneous information about surface roughness, shape and waviness.