Type
Equipment
Acronym
Dektak 150
Code
APP/00232
Date of commissioning
01 January 2011 → …
Research disciplines
-
Natural sciences
- Photonics, optoelectronics and optical communications
Keywords
surface roughness
metrology
step height measurement
profilometry
thin film characterization
Brand Name/manufacturer
Dektak 150
Other information
Description
Profilometer, for measuring step heights on samples with range varying from few nanometer to several 100 micrometer.