Scanning electron microscopy (SEM) provides a topographic view of the surface of a sample by irradiating the surface with a fine electron beam. The JEOL JSM 7100F SEM is equipped with a cryo-stage (PP3010T Cryo-SEM Preparation System, Quorum Technologies) for sample preparation which allows to fracture a sample and sublime the free water, thus exposing the internal microstructure of high moisture products. Structures in the range of 100 nm up to several µm can be visualized.