Inventor of
ELECTRON MICROSCOPY GRIDS AND HIGH-RESOLUTION STRUCTURAL DETERMINATION METHODS
Patent application(s)
WO2022038251
( 23 February 2022 )
ELECTRON MICROSCOPY GRID
Patent application(s)
WO2020173952
( 02 September 2020 )
Granted patent(s)
US12125668
( 21 October 2024 )
METHODS FOR REGIOSELECTIVE FUNCTIONALIZING A SURFACE OF AN ELECTRON MICROSCOPY GRID
Patent application(s)
WO2023099642
( 07 June 2023 )