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Vic De Ridder

Prijzen & Erkenningen

4 Resultaten

2024

Improved defect detection and classification method for advanced IC nodes by using slicing aided hyper inference with refinement strategy

Vic De RidderBappaditya DeyVictor BlancoSandip HalderBartel Van Waeyenberge

Towards improved semiconductor defect inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS

Ying-Lin ChenJacob DeforceVic De RidderBappaditya DeyVictor M. Blanco CarballoSandip HalderPhilippe Leray

2023

SEMI-CenterNet : a machine learning facilitated approach for semiconductor defect inspection

Vic De RidderBappaditya DeyEnrique DehaerneSandip HalderStefan De GendtBartel Van Waeyenberge

SEMI-DiffusionInst : a diffusion model based approach for semiconductor defect classification and segmentation

Vic De RidderBappaditya DeySandip HalderBartel Van Waeyenberge