Research Explorer

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Researcher

Felix Cardon

Awards & Distinctions

130 Results

2002

A BEEM study on the effects of the annealing temperature on barrier height inhomogeneity of CoSi2/Si contact formed in Co-Ti-Si systems.

SY ZHUXP QUGP RUBZ LIChristophe DetavernierRoland VanmeirhaegheFelix Cardon

A2 Journal Article in CHINESE JOURNAL OF SEMICONDUCTORS

Double threshold behaviour of I-V characteristics of CoSi2/Si Schottky contacts.

SY ZHUGP RUXP QUBZ LIRoland VanmeirhaegheChristophe DetavernierFelix Cardon

A1 Journal Article in CHINESE PHYSICS

Silicide formation for Ni and Pd bilayers on Si (100) substrates

Christophe DetavernierRoland VanmeirhaegheFelix Cardon

Sillicide formation for Ni and Pd bilayers on Si(100) substrates

XP QUChristophe DetavernierRoland VanmeirhaegheFelix Cardon

Surface and interface morphology of CoSi2 films formed by multilayer solid-state reaction.

GP RUBZ LIGB JIANGXP QUJun LiuRoland VanmeirhaegheFelix Cardon

A1 Journal Article in MATERIALS CHARACTERIZATION

2001

CoSi2 formation through SiO2

Christophe DetavernierRoland VanmeirhaegheFelix CardonK MAEX

A1 Journal Article in THIN SOLID FILMS

CoSi2 nucleation in the presence of Ge.

Christophe DetavernierRoland VanmeirhaegheFelix CardonK MAEX

A1 Journal Article in THIN SOLID FILMS

Electrical characterization of Ar-ion-bombardment-induced damage in Au/Si and PtSi/Si Schottky barrier contacts.

SY ZHUChristophe DetavernierRoland VanmeirhaegheFelix CardonAnja BlondeelPaul ClauwsGP RUBZ LI

A1 Journal Article in SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Formation of epitaxial CoSi2 by a Cr or Mo interlayer: Comparison with a Ti interlayer.

Christophe DetavernierRoland VanmeirhaegheFelix CardonK MAEXH BENDERB BRIJSW VANDERVORST

A1 Journal Article in JOURNAL OF APPLIED PHYSICS

Optical and structural characterisation of post deposition annealed electroluminescent blue emitting thin film phosphors

Davy WautersFelix CardonRoland Vanmeirhaeghe

Orientation-dependent stress build-up during the formation of epitaxial CoSi2.

A STEEGENChristophe DetavernierAlbert LauwersK MAEXRoland VanmeirhaegheFelix Cardon

A1 Journal Article in MICROELECTRONIC ENGINEERING

Studie van de invloed van technologisch belangrijke productieprocesstappen op de elektrische eigenschappen van p-InP en n-InxGa1-xAs met behulp van schottkybarrières

Lieve GoubertFelix CardonRoland Vanmeirhaeghe

2000

A BEEM study of Schottky barrier height distributions of ultrathin CoSi2/n-Si(100) formed by solid phase epitaxy.

SY ZHUChristophe DetavernierRoland VanmeirhaegheXP QUGP RUFelix CardonBZ LI

A1 Journal Article in SEMICONDUCTOR SCIENCE AND TECHNOLOGY

A photoluminescence study of CaS: Pb thin films.

Jorg VersluysDirk PoelmanDavy WautersRoland VanmeirhaegheFelix Cardon

Ballistic electron emission microscopy studies of the temperature dependence of Schottky barrier height distribution in CoSi2/n-Si(1 0 0) diodes formed by solid phase reaction

Shiyang ZhuXin-Ping QuRoland VanmeirhaegheChristophe DetavernierGuo-Ping RuFelix CardonBing-Zong Li

A1 Journal Article in SOLID-STATE ELECTRONICS

Barrier height inhomogeneities of epitaxial CoSi2 Schottky contacts on n-Si (100) and (111).

SY ZHURoland VanmeirhaegheChristophe DetavernierFelix CardonGP RUXP QUBZ LI

A1 Journal Article in SOLID-STATE ELECTRONICS

CoSi2 formation in the Ti/Co/SiO2/Si system

Christophe DetavernierRoland VanmeirhaegheFelix CardonK MAEXH BENDERSY ZHU

A1 Journal Article in JOURNAL OF APPLIED PHYSICS

Determination of capture cross sections and trap depths of dominant centres in AgCl microcrystals doped with [Ru(CN)(6)](4-) complexes.

Jian HuaFreddy CallensFelix CardonD VANDENBROUCKE

A1 Journal Article in JOURNAL OF PHYSICS D-APPLIED PHYSICS

Electrical characteristics of CoSi2/n-Si(100) Schottky barrier contacts formed by solid state reaction.

SY ZHUChristophe DetavernierRoland VanmeirhaegheFelix CardonGP RUXP QUBZ LI

A1 Journal Article in SOLID-STATE ELECTRONICS

Emission color of Cu and Ag doped ACTFEL devices: a microscopic study.

Davy WautersDirk PoelmanR VANMEIRHAEGHEFelix Cardon

Influence of Ti on CoSi2 nucleation.

Christophe DetavernierRoland VanmeirhaegheFelix CardonK MAEXW VANDERVORSTB BRIJS

A1 Journal Article in APPLIED PHYSICS LETTERS

Influence of mixing entropy on the nucleation of CoSi2

Christophe DetavernierRoland VanmeirhaegheFelix CardonK Maex

A1 Journal Article in PHYSICAL REVIEW B

Ion-bombardment effects on PtSi/n-Si Schottky contacts studied by ballistic electron emission microscopy.

GP RUXP QUSY ZHUBZ LIChristophe DetavernierRoland VanmeirhaegheFelix CardonRA DONATONK MAEX

A1 Journal Article in JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B

Nondestructive characterization of thin silicides using x-ray reflectivity.

Christophe DetavernierRoger De GryseRoland VanmeirhaegheFelix CardonGP RUXP QUBZ LIRA DONATONK MAEX

A1 Journal Article in JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS

Optical characterisation of SrS: Cu and SrS: Cu,Ag EL devices.

Davy WautersDirk PoelmanRoland VanmeirhaegheFelix Cardon

A1 Journal Article in JOURNAL OF LUMINESCENCE

Photoluminescence of SrS: Cu, Ag thin films: influence of substrate and annealing conditions.

Dirk PoelmanDavy WautersJorg VersluysRoland VanmeirhaegheFelix Cardon

Photoluminescence of SrS: Cu,Ag and SrS1-xSex: Cu,Ag thin films.

Dirk PoelmanDavy WautersRoland VanmeirhaegheFelix Cardon

A1 Journal Article in SOLID STATE COMMUNICATIONS

Photoluminescent, electroluminescent and structural properties of CaS: Cu and CaS: Cu, Ag thin films.

Davy WautersDirk PoelmanRoland VanmeirhaegheFelix Cardon

A1 Journal Article in JOURNAL OF PHYSICS-CONDENSED MATTER

Shallow electron traps induced by [Ru(CN)(6)](4-) in AgCl microcrystals: a computer simulation study of transient microwave photoconductivity.

Jian HuaFreddy CallensFelix CardonHans De MeyerD VANDENBROUCKE

A1 Journal Article in JOURNAL OF PHYSICS D-APPLIED PHYSICS

Studie van de invloed van productieprocesstappen op de elektrische eigenschappen van metaal/n-GaAs en metaal/n-AlxGa1-x schottkycontacten

Greet VanalmeFelix CardonRoland Vanmeirhaeghe

The influence of Ti cappings layes on CoSi2 formation.

Christophe DetavernierRoland VanmeirhaegheFelix CardonRA DONATONK MAEX

A1 Journal Article in MICROELECTRONIC ENGINEERING

The influence of mixing entropy on the nucleationof CoSi2.

Christophe DetavernierRoland VanmeirhaegheFelix CardonK MAEX

A2 Journal Article in PHYSICAL REVIEW B

1999

A BEEM study of PtSi Schottky contacts on ion-milled Si

GP RUChristophe DetavernierRA DONATONAnja BlondeelPaul ClauwsRoland VanmeirhaegheFelix CardonK MAEXXP QUSY ZHU et al.

A BEEM study of the temperature dependence of the barrier height distribution in PtSi/n-Si Schottky diodes.

S ZHURoland VanmeirhaegheChristophe DetavernierGP RUBZ LIFelix Cardon

A1 Journal Article in SOLID STATE COMMUNICATIONS

A ballistic electron emission microscopy study of barrier height inhomogeneities introduced in Au/III-V semiconductor Schottky barrier contacts by chemical pretreatments.

Greet VanalmeLieve GoubertRoland VanmeirhaegheFelix CardonPeter Van Daele

A1 Journal Article in SEMICONDUCTOR SCIENCE AND TECHNOLOGY

BEEM studies of the PtSi/Si(100) interface electronic structure.

T VDOVENKOVAV STRIKHAFelix CardonRoland VanmeirhaegheGreet Vanalme

A1 Journal Article in JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA

CoSi2 formation in the presence of interfacial silicon oxide.

Christophe DetavernierRoland VanmeirhaegheFelix CardonRA DONATONK MAEX

A1 Journal Article in APPLIED PHYSICS LETTERS

Effects of rapid thermal annealing on electron beam evaporated SrS: Ce thin film electroluminescent devices made in H2S ambient.

Davy WautersDirk PoelmanRoland VanmeirhaegheFelix Cardon

A1 Journal Article in JOURNAL OF CRYSTAL GROWTH

Formation and characterization of SPE grown ultra-thin cobalt disilicide film

XP QUGP RUBZ LIChristophe DetavernierRoland VanmeirhaegheFelix Cardon

Formation and characterization of spe grown ultra-thin cobalt disilicide film.

GP RULI BING-ZONGChristophe DetavernierR VANMEIRHAEGHEFelix Cardon

Intrinsic optical and structural properties of SrS thin films.

Dirk PoelmanDavy WautersRoland VanmeirhaegheFelix Cardon

A1 Journal Article in THIN SOLID FILMS

Optical time resolved spectroscopy of SrS: Cu, Ag ACTFEL devices

Davy WautersDirk PoelmanR VANMEIRHAEGHEFelix Cardon

Photoluminescence study of SrS: Cu, Ag and SrS1-xSex: Cu, Ag thin films

Dirk PoelmanDavy WautersR VANMEIRHAEGHEFelix Cardon

The influence of Ti capping layers on CoSi/sub 2/ formation in the presence of interfacial oxide

Christophe DetavernierR.A. DONATONK. MAEXS. JINH. BENDERRoland VanmeirhaegheFelix Cardon

The influence of Ti capping layers on CoSi2 formation in tee presence of interfacial oxide

Christophe DetavernierR DONATONK MAEXS JINH BENDERRoland VanmeirhaegheFelix Cardon

Thermally enhanced quantum efficiency in hydrogenated amorphous silicon p-i-n photodiodes studied by intensity-modulated photocurrent spectroscopy.

D VANMAEKELBERGHJ VAN DE LAGEMAATREI SCHROPPFelix Cardon

A1 Journal Article in PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES

Transient photoconductivity study of shallow electron traps in [Ru(CN)(6)](4-) doped AgCl microcrystals: effects of doping concentration and position.

Jian HuaFreddy CallensFelix CardonD VANDENBROUCKE

A1 Journal Article in IMAGING SCIENCE JOURNAL

1998

A ballistic electron-emission microscopy (BEEM)-investigation of the effects of chemical pretreatments on III-V semiconductor Schottky barriers.

Roland VanmeirhaegheGreet VanalmeLieve GoubertFelix CardonPeter Van Daele

An atomic force microscopy study of thin CoSi2 films formed by solid state reaction

GP RUJ LIUXP QUBZ LIChristophe DetavernierRoland VanmeirhaegheFelix Cardon

Ballistic electron emission microscopy study of barrier height inhomogeneities introduced in Au/n-Si Schottky contacts by a HF pretreatment.

Christophe DetavernierRoland VanmeirhaegheR DONATONK MAEXFelix Cardon

A1 Journal Article in JOURNAL OF APPLIED PHYSICS

Non-destructive characterization of thin silicides using X-ray reflectivity

Christophe DetavernierR DEGRYSERoland VanmeirhaegheFelix CardonGP RUBZ LI

1997

A ballistic electron emission microscopy (BEEM) study of the barrier height change of Au/n-GaAs Schottky barriers due to reactive ion etching.

Greet VanalmeRoland VanmeirhaegheFelix CardonPeter Van Daele

A1 Journal Article in SEMICONDUCTOR SCIENCE AND TECHNOLOGY

A ballistic electron emission microscopy (BEEM)-investigation of the effects of reactive ion etching (RIE) and of chemical pretreatment on III-V semiconductors.

Roland VanmeirhaegheGM VANALMELieve GoubertFelix CardonPeter Van Daele

A1 Journal Article in MICROSCOPY OF SEMICONDUCTING MATERIALS

A study of electrically active defects created in p-InP by CH4:H-2 reactive ion etching.

Lieve GoubertRoland VanmeirhaeghePaul ClauwsFelix CardonPeter Van Daele

A1 Journal Article in JOURNAL OF APPLIED PHYSICS

Influence of the growth conditions on the properties of CaS:Eu electroluminescent thin films.

Dirk PoelmanRita VercaemstRoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in JOURNAL OF LUMINESCENCE

Possibilities and limitations of blue electroluminescence in CaS:Pb2+ thin films.

Dirk PoelmanRoland VanmeirhaegheBA VERMEERSCHFelix Cardon

A1 Journal Article in JOURNAL OF PHYSICS D-APPLIED PHYSICS

1996

Electrochemical reduction vs, vapour deposition for n-GaAs/Cu Schottky-barrier formation : a comparative study

Philippe VereeckenGM VANALMERoland VanmeirhaegheFelix CardonWalter Gomes

A1 Journal Article in JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS

Quantitative prediction of acceptor concentration reduction in boron doped silicon due to electron irradiation

JL EveraertFrans VerhaegenRoland VanmeirhaegheJozef UyttenhoveFelix Cardon

A1 Journal Article in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

The occurrence of multiple dielectric-loss curves for silver halide emulsions: difficulties of interpretation

Freddy CallensD VANDENBROUCKELeen SoensFelix Cardon

A2 Journal Article in Journal Appl. Phys. 77(11), pp. 5869-5821 (1995), figg. 12

Transient microwave photoconductivity and computer simulation study of and Rh^+ doped Agi Microcrystals

Marinus Van Den EedenFreddy CallensFelix CardonD VANDENBROUCKER DE KEYZER

A2 Journal Article in J. Imag; Sei. Technol. 39 (5), pp. 393-402 (1995)

1995

A BALLISTIC-ELECTRON-EMISSION MICROSCOPY (BEEM) STUDY OF THE BARRIER HEIGHT CHANGE OF AU/N-GAAS SCHOTTKY CONTACTS DUE TO MECHANICAL POLISHING.

JL EVERAERTRoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in SEMICONDUCTOR SCIENCE AND TECHNOLOGY

A DETAILED XPS STUDY OF THE RARE-EARTH COMPOUNDS EUS AND EUF3.

R VERCAEMSTDirk PoelmanLucien FiermansRoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA

A method for evaluating the frequence characteristics of ac thin film electroluminescent devices.

ZX WANGFelix Cardon

A1 Journal Article in JOURNAL OF PHYSICS D-APPLIED PHYSICS

AN XPS STUDY OF THE DOPANTS VALENCE STATES AND THE COMPOSITION OF CAS1-XSEXEU AND SRS1-XSEXCE THIN-FILM ELECTROLUMINESCENT DEVICES.

Rita VercaemstDirk PoelmanRoland VanmeirhaegheLucien FiermansWilly LaflereFelix Cardon

A1 Journal Article in JOURNAL OF LUMINESCENCE

An XPS study of the effects of semiconductor processing treatments used to make InP optoelectronic devices.

Roland VanmeirhaegheLieve GoubertLucien FiermansWilly LaflereFelix CardonPeter De DobbelaerePeter Van Daele

A1 Journal Article in MICROSCOPY OF SEMICONDUCTING MATERIALS

Electrical-transport in (100)CoSi2/Si contacts.

Albert LauwersKK LARSENM VANHOVERonald VerbeeckK MAEXM VANROSSUMAn VercaemstRoland VanmeirhaegheFelix Cardon

A1 Journal Article in JOURNAL OF APPLIED PHYSICS

Hydrogen passivation caused by 'soft' sputter etch cleaning of Si.

AS VERCAEMSTRoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in SOLID-STATE ELECTRONICS

OCCURRENCE OF MULTIPLE DIELECTRIC-LOSS CURVES FOR SILVER-HALIDE EMULSIONS - DIFFICULTIES OF INTERPRETATION.

Freddy CallensD VANDENBROUCKEL SOENSFelix Cardon

A1 Journal Article in JOURNAL OF APPLIED PHYSICS

Studie van de elektrische eigenschappen van Si/SiO2 strukturen met een ultradunne oxydelaag

Michel DepasFelix Cardon

Studie van rode elektroluminescentie op basis van europium gedoteerde CaS dunne filmen

Rita VercaemstFelix Cardon

THE INFLUENCE OF SE-COEVAPORATION ON THE EMISSION-SPECTRA OF CAS-EU AND SRS-CE THIN-FILM ELECTROLUMINESCENT DEVICES.

Dirk PoelmanRita VercaemstRoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in JOURNAL OF LUMINESCENCE

TRANSIENT MICROWAVE PHOTOCONDUCTIVITY AND COMPUTER-SIMULATION STUDY OF IR3+-DOPED AND RH3+-DOPED AGCL MICROCRYSTALS.

M VANDENEEDENFreddy CallensFelix CardonD VANDENBROUCKER DEKEYZER

A1 Journal Article in JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY

1994

COMPUTER-SIMULATION OF TRANSIENT MICROWAVE PHOTOCONDUCTIVITY IN SILVER-HALIDE MICROCRYSTALS.

M VANDENEEDENFreddy CallensA DEROOSEFelix Cardon

A1 Journal Article in JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY

Electrical characteristics of Al/Si02/n-Si tunnel-diodes with an oxide layer grown by rapid thermal-oxidation.

Michel DepasRoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in SOLID-STATE ELECTRONICS

Elektroluminescentie in dunne-filmstructuren op basis van SrS, gedoteerd met Ce

Dirk PoelmanFelix Cardon

Influence of defect passivation by hydrogen on the Schottky-barrier height of GaAs and InP contracts.

Roland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in JOURNAL OF APPLIED PHYSICS

Thin film electroluminescence in SrS:Ce: the quest for blue light

Dirk PoelmanRita VercaemstRoland VanmeirhaegheWilly LaflereFelix Cardon

A4 Journal Article in BELVAC NEWS

XPS study of TbF3 and TbOF centres in ZnS.

J Van Den BosscheKristiaan NeytsPatrick De VisschereDorina CorlatanHerman PauwelsRita VercaemstLucien FiermansDirk PoelmanRoland VanmeirhaegheWilly Laflere et al.

A1 Journal Article in PHYSICA STATUS SOLIDI A-APPLIED RESEARCH

1993

DETERMINATION OF THE CONCENTRATION OF INTERSTITIAL SILVER IONS IN SILVER-HALIDE EMULSION GRAINS BY MEANS OF DIELECTRIC-LOSS MEASUREMENTS - DIFFICULTIES OF INTERPRETATION.

Freddy CallensD VANDENBROUCKELeen SoensM VANDENEEDENFelix Cardon

A1 Journal Article in JOURNAL OF PHOTOGRAPHIC SCIENCE

EFFECT OF MOISTURE ON PERFORMANCE OF SRS-CE THIN-FILM ELECTROLUMINESCENT DEVICES.

Dirk PoelmanRita VercaemstRoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS

ON THE INFLUENCE OF SPUTTER ETCH CLEANING ON THE SILICIDATION, THE THERMAL-STABILITY AND THE ELECTRICAL CHARACTERISTICS OF TI/P-SI CONTACTS.

AS VERCAEMSTRoland VanmeirhaegheWilly LaflereFelix CardonW DEBOSSCHERRJ SCHREUTELKAMP

A1 Journal Article in SOLID-STATE ELECTRONICS

ON THE RELATIONSHIP BETWEEN INTERFACIAL DEFECTS AND SCHOTTKY-BARRIER HEIGHT IN AG, AU, AND AL/N-GAAS CONTACTS.

R VANDEWALLERoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in JOURNAL OF APPLIED PHYSICS

RECOMBINATION IN SEMICONDUCTOR ELECTRODES - INVESTIGATION BY THE ELECTRICAL AND OPTOELECTRICAL IMPEDANCE METHOD.

D VANMAEKELBERGHAR DEWITFelix Cardon

A1 Journal Article in JOURNAL OF APPLIED PHYSICS

TUNNEL OXIDES GROWN BY RAPID THERMAL-OXIDATION.

Michel DepasRoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in MICROELECTRONIC ENGINEERING

1992

A QUANTITATIVE-ANALYSIS OF CAPACITANCE PEAKS IN THE IMPEDANCE OF AL/SIOX/P-SI TUNNEL-DIODES.

Michel DepasRoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in SEMICONDUCTOR SCIENCE AND TECHNOLOGY

On the role of defects in some compound semiconductor (GaAs, InP, CdTe) Schottky Barriers

Roland VanmeirhaegheWilly LaflereFelix Cardon

RECOMBINATION IN SEMICONDUCTOR ELECTRODES - INVESTIGATION BY THE ELECTRICAL-IMPEDANCE METHOD.

D VANMAEKELBERGHFelix Cardon

A1 Journal Article in ELECTROCHIMICA ACTA

Spectral shifts in thin film electroluminescent devices: an interference effect.

Dirk PoelmanRoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in JOURNAL OF PHYSICS D-APPLIED PHYSICS

THE INFLUENCE OF SE COEVAPORATION ON THE ELECTROLUMINESCENT PROPERTIES OF SRSCE THIN-FILMS.

Dirk PoelmanRoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in JOURNAL OF LUMINESCENCE

1991

A STUDY OF SPUTTER-INDUCED DEFECTS IN MAGNETRON-SPUTTERED COSI2 AND TISI2 SCHOTTKY BARRIERS ON NORMAL-TYPE AND PARA-TYPE GAP

E KABUSHEMEYERoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING

AN INVESTIGATION ON THE INFLUENCE OF SI SURFACE PRETREATMENT ON THE FREQUENCY-DEPENDENCE OF THE IMPEDANCE OF CO N-SI SCHOTTKY BARRIERS

AL DELAERERoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in SEMICONDUCTOR SCIENCE AND TECHNOLOGY

ON THE RELATIONSHIP BETWEEN THE SURFACE-COMPOSITION OF THE SUBSTRATE AND THE SCHOTTKY-BARRIER HEIGHT IN AU/N-CDTE CONTACTS

Roland VanmeirhaegheR VANDEWALLEWilly LaflereFelix Cardon

A1 Journal Article in JOURNAL OF APPLIED PHYSICS

On the relationship between the surface composition of the substrate and the Schottky-barrier height in Au/n-CdTe contacts

Roland VanmeirhaegheRonald Van De WalleWilly LaflereFelix Cardon

A2 Journal Article in Journal Appl. Phys., 70, nr. 4, pp. 2200-2203

TITANIUM SILICIDE/P-SI SCHOTTKY BARRIERS FORMED BY RAPID THERMAL-PROCESSING IN NITROGEN

W DEBOSSCHERRoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in SOLID-STATE ELECTRONICS

Titanium silicide p-Si Schottky barriers formed by rapid thermal processing in nitrogen

W DE BOSSCHERRoland VanmeirhaegheWilly LaflereFelix Cardon

A2 Journal Article in Soc. St. Electron, 34(8), pp. 827-834, 11 figg

Étude du comportement électrique et photovoltaique du contact Schottky fait sur le phosphure de gallium

Ernest KabushemeyeFelix Cardon

1990

On the electrical properties, the interfacial reactivity and the thermal stability of CoSi₂/-, TiSi₂/-, Co/- and Ti/p-InP Schottky barriers

LMO Van den BergheRoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in SOLID-STATE ELECTRONICS

1988

A study of the electrical and interfacial properties of sputtered Ti/Si and sputtered TiSi₂/Si Schottky barriers

W De BosscherRoland VanmeirhaegheA De LaereWilly LaflereFelix Cardon

A1 Journal Article in SOLID-STATE ELECTRONICS

A study of the electrical and photovoltaic properties of magnetron sputtered Ti/p-InP Schottky barriers

Roland VanmeirhaegheLMO Van den BergheWilly LaflereFelix Cardon

A1 Journal Article in SOLID-STATE ELECTRONICS

Electrical and photovoltaic properties of metal/p-InP Schottky barriers

Yiping SongFelix Cardon

The growth of thin oxide layers on GaAs in methanol

Hilde BarbéRoland VanmeirhaegheFelix Cardon

A1 Journal Article in SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Transient fotogeleiding in zilverhalogenide mikrokristallen

Guy VekemanFelix Cardon

1987

On the influence of the thin interfacial oxide layer on the electrical and photovoltaic properties of Au/oxide/p-InP diodes

Yiping SongRoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Sputter-induced damage in Al/n-GaAs and Al/p-GaAs Schottky barriers

DA VandenbrouckeRoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in SEMICONDUCTOR SCIENCE AND TECHNOLOGY

1986

Defects introduced in InP by mechanical polishing and studied by means of Au- and Al-p-InP Schottky barriers

LMO Van den BergheRoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in SOLID-STATE ELECTRONICS

On the difference in apparent barrier height as obtained from capacitance-voltage and current-voltage-temperature measurements on Al/p-InP Schottky barriers

YP SongRoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in SOLID-STATE ELECTRONICS

Studie van de elektrische eigenschappen van Si MIS Schottky-Barriere structuren

Peter HanselaerFelix Cardon

The influence of a HF and an annealing treatment on the barrier height of p- and n-type Si MIS structures

PL HanselaerWilly LaflereRoland VanmeirhaegheFelix Cardon

A1 Journal Article in APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING

1985

A quantitative expression for partial Fermi level pinning at semiconductor/redox electrolyte interfaces

Roland VanmeirhaegheFelix CardonWalter Gomes

A1 Journal Article in JOURNAL OF ELECTROANALYTICAL CHEMISTRY

Characteristics of the RuO₂-n-GaAs Schottky barrier

DA VandenbrouckeRoland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in JOURNAL OF PHYSICS D-APPLIED PHYSICS

1984

Current-voltage characteristic of Ti-pSi metal-oxide-semiconductor diodes

PL HanselaerWilly LaflereRoland VanmeirhaegheFelix Cardon

A1 Journal Article in JOURNAL OF APPLIED PHYSICS

1983

On interfacial charges in the oxide layer of mis-type Ag- and Au-n GaAs Schottky barriers

Roland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in SOLID-STATE ELECTRONICS

1982

An experimental study of Ti-pSi MIS type Schottky barriers

PL HanselaerWilly LaflereRoland VanmeirhaegheFelix Cardon

A1 Journal Article in JOURNAL OF PHYSICS D-APPLIED PHYSICS

Electron trapping in the oxide layer of MIS-type Al-, Au-, Ag- and Sn-n-type GaAs Schottky barriers

Willy LaflereRoland VanmeirhaegheFelix Cardon

A1 Journal Article in SOLID-STATE ELECTRONICS

Investigation on photoelectrochemical cells based upon silicon/methanol interfaces, part 1 : n-type Si

Philip BrondeelMarc MadouWalter GomesFelix Cardon

A1 Journal Article in SOLAR ENERGY MATERIALS

Investigation on photoelectrochemical cells based upon silicon/methanol interfaces, part 2 : p-type Si

Marc MadouPhilip BrondeelWalter GomesP HanselaerFelix Cardon

A1 Journal Article in SOLAR ENERGY MATERIALS

Study of electron traps in the thin interfacial oxide layer of Al-, Au- and Sn-n GaAs Schottky barriers by detrapping experiments

Roland VanmeirhaegheWilly LaflereFelix Cardon

A1 Journal Article in SOLID-STATE ELECTRONICS

1981

Investigation of interface states in MIS-type Al-, Au- and Sn-GaAs Schottky barriers with a thin interfacial oxide layer

Roland VanmeirhaegheWilly LaflereYu-Min LiFelix Cardon

A1 Journal Article in JOURNAL OF PHYSICS D-APPLIED PHYSICS

1980

Effects of thin oxide layers on the characteristics of GaAs MIS solar cells

Roland VanmeirhaegheFelix CardonWalter Gomes

A1 Journal Article in PHYSICA STATUS SOLIDI A-APPLIED RESEARCH

Experimentele studie van GaAs/metaal en GaAs/Elektrolyt Schottky-barrières onder belichting

Roland L VanmeirhaegheFelix CardonWilly Dekeyser

Investigation of the C-V behaviour of GaAs-metal and GaAs-electrolyte contacts under forward bias

Willy LaflereRoland VanmeirhaegheFelix CardonWalter Gomes

A1 Journal Article in JOURNAL OF PHYSICS D-APPLIED PHYSICS

1979

Influence of the surface pretreatment on the photocurrent-voltage characteristics and the spectral response of the N-GaAs-electrolyte interface

Roland VanmeirhaegheFelix CardonWalter Gomes

A1 Journal Article in BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS

Photocurrent oscillations at the n-GaAs/electrolyte interface

Roland VanmeirhaegheFelix CardonWalter Gomes

A1 Journal Article in ELECTROCHIMICA ACTA

1978

On the frequency and voltage dependence of the impedance of n- and p-type GaAs/metal Schottky barriers

Willy LaflereRoland VanmeirhaegheFelix CardonWalter Gomes

A1 Journal Article in SURFACE SCIENCE

Some Electrochemical Processes at the n- and p-InP Electrodes

Alfons VervaetWalter GomesFelix Cardon

A1 Journal Article in JOURNAL OF ELECTROANALYTICAL CHEMISTRY

1976

On the application of the Kramers-Kronig relations to problems concerning the frequency dependence of electrode impedance

Roland VanmeirhaegheEC DutoitFelix CardonWalter Gomes

A1 Journal Article in ELECTROCHIMICA ACTA

On the frequency-dependence of the impedance of n- and p-type gallium arsenide electrodes

Willy LaflereRoland VanmeirhaegheFelix CardonWalter Gomes

A1 Journal Article in SURFACE SCIENCE

1975

Investigation on frequency-dependence of impedance of nearly ideally polarizable semiconductor electrodes CDSE, CDS and TIO₂

EC DutoitRoland VanmeirhaegheFelix CardonWalter Gomes

A1 Journal Article in BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS

On the application of the Kramers-Kronig relations to problems concerning the frequency dependence of electrode impedance

Roland VanmeirhaegheEC DutoitFelix CardonWalter Gomes

A1 Journal Article in ELECTROCHIMICA ACTA

Hydrogen passivation caused by 'soft' sputter etch cleaning of Si. Materials Research Society, Sympos. Proceedings, 1994, nr. 337, pp. 657-662, 4 figg.

AS VERCAEMSTRoland L Van MeirhaegheWilly LaflereFelix Cardon