Research Explorer

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Alexandra Kourfali

Prijzen & Erkenningen

15 Resultaten

2020

In-circuit debugging with dynamic reconfiguration of FPGA interconnects

Alexandra KourfaliDirk Stroobandt

A1 Artikel in een tijdschrift in ACM TRANSACTIONS ON RECONFIGURABLE TECHNOLOGY AND SYSTEMS

2019

An integrated on-silicon verification method for FPGA overlays

Alexandra KourfaliFlorian FrickeMichael HuebnerDirk Stroobandt

A1 Artikel in een tijdschrift in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

In-circuit fault tolerance for FPGAs using dynamic reconfiguration and virtual overlays

Alexandra KourfaliDirk Stroobandt

A1 Artikel in een tijdschrift in MICROELECTRONICS RELIABILITY

Novel hardware verification methods for FPGAs

Alexandra KourfaliDirk Stroobandt

VHDL design tool flow for portable FPGA implementation

Vijaykumar GuddadAlexandra KourfaliDirk Stroobandt

2018

Superimposed in-circuit debugging for self-healing FPGA overlays

Alexandra KourfaliDirk Stroobandt

2017

In-Circuit FPGA Debugging using Parameterised Reconfigurations

Alexandra KourfaliDirk Stroobandt

SICTA : a superimposed in-circuit fault tolerant architecture for SRAM-based FPGAs

Alexandra KourfaliAmit KulkarniDirk Stroobandt

Superimposed In-circuit fault mitigation for dynamically reconfigurable FPGAs

Alexandra KourfaliDavid Merodio CodinachsDirk Stroobandt

2016

Efficient hardware debugging using parameterized FPGA reconfiguration

Alexandra KourfaliDirk Stroobandt

Enhancing SEU mitigation with microscrubbing for commercial SRAM-based FPGAs

Alexandra KourfaliDirk StroobandtDavid Merodio Codinachs

2015

Test set generation almost for free using a Run-Time FPGA reconfiguration technique

Alexandra KourfaliDirk Stroobandt

Towards efficient hardware debugging using parameterized FPGA reconfiguration

Alexandra KourfaliDirk Stroobandt

2014

Parameterised FPGA reconfigurations for efficient test set generation

Alexandra KourfaliElias VansteenkisteDirk Stroobandt

Pre-mapping fault injection in FPGA-based parameterised test set generation for ASIC testing

Alexandra KourfaliKarel BruneelDirk Stroobandt