Code
3G020911
Duration
01 January 2011 → 31 December 2014
Funding
Research Foundation - Flanders (FWO)
Promotor
Research disciplines
-
Natural sciences
- Condensed matter physics and nanophysics
Keywords
thin film growth
XAS
bimetallic materials
Atomic Layer Deposition (ALD)
XRF
Project description
The research involves the development of synchrotron based measuring techniques for the in situ characterisation of an atomic deposition process of inorganic materials in/onto solids. As specific application the deposition and formation of bimetallic materilas are studied.