A novel XEOL microscope for synchrotron applications

01 January 2010 → 31 December 2015
Research Foundation - Flanders (FWO)
Research disciplines
  • Natural sciences
    • Analytical chemistry
    • Macromolecular and materials chemistry
synchrotron radiation imaging surface specific
Project description

In this application we will construct a XEOL microscope which can be coupled to an electrochemical or environmental cell or deployed independently in a synchrotron beam line. The tool will be capable of real time, in-situ, chemically specific imaging of surfaces exposed to a wide range of environments. The lateral resolution will be of the order of 1 tot 50 μm.