Towards lab-based hard X-ray ptychography

01 January 2024 → 31 December 2027
Research Foundation - Flanders (FWO)
Research disciplines
  • Natural sciences
    • Photonics, optoelectronics and optical communications
    • Applied and interdisciplinary physics
  • Engineering and technology
    • Image and language processing
X-ray imaging Coherent diffraction imaging ptychography
Project description

High resolution X-ray transmission imaging, or X-ray microscopy, is an increasingly popular tool in many research areas. When ultra-high resolution, better than 100nm, is needed, coherent diffraction imaging techniques such as hard X-ray ptychographic imaging (XPI) are prime candidates. However, due to the requirements of XPI on coherence, it has hitherto only been applied at synchrotron facilities, which have limited access. Enabling this technique at the lab would be a major step forward in the evolution of X-ray microscopy, as the achievable resolution is close to the diffraction limit. Recently, we have shown the possibility to perform this technique at a lab facility using very specific equipment (Batey et al., PRL 2021). In this project, we will investigate techniques to evaluate, improve and consolidate this methodology as a laboratory imaging tool for users’ applications. To achieve this, we will use combined hard- and software solutions, e.g. enhance the effective brilliance of the source by using a multi-pinhole and by improving the ptychographic reconstruction to cope with low count rates. Different schemes will be designed, tested and evaluated through simulations and experiments at several different lab sources, using both standard test patterns and samples from real applications.