Project

Scattering-type scanning near-field mm-wave microscope

Duration
01 January 2008 → 30 December 2013
Funding
Research Foundation - Flanders (FWO)
Research disciplines
  • Natural sciences
    • Applied mathematics in specific fields
    • Classical physics
    • Optical physics
  • Engineering and technology
    • Electronics
    • Multimedia processing
    • Nanotechnology
    • Design theories and methods
    • Biological system engineering
    • Signal processing
Keywords
inverse scattering mm-wave imaging micro probes computational electromagnetics mm-wave microscopy
 
Project description

To study, realize and validate a vector scanning near-field mm-wave microscope s-(SNMM, 30 - 300GHz), which will be very performing in image formation and resolution, on the basis of the fundamental study of advanced microprobes, original modulation techniques and sophisticated Maxwell-based electromagnetic imaging algorithms. To perform tests for a number of specific scientific/engineering applications: electronics, biotechnology, material science.