Your browser does not support JavaScript or JavaScript is not enabled. Without JavaScript some functions of this webapplication may be disabled or cause error messages. To enable JavaScript, please consult the manual of your browser or contact your system administrator.

Infrastructure

Thin Film Thickness Measurement Microscope

Information

Contact

Access & Terms of use

Manager of the research infrastructure

Thomas Vervust

Department of Electronics and information systems

Scientific co-ordinator

Günther Roelkens

Department of Information technology

Operational contactperson

Steven Verstuyft

Department of Information technology