The JEOL JEM-2200FS is a FEG high resolution transmission electron microscope within the TEM Core Facility. It is equipped with a 200 kV field emission gun, image lens spherical aberration corrector, electron energy loss spectrometer (filter), and energy dispersive x-ray (EDX) spectrometer. It achieves a spatial resolution of 0.13 nm.

The HRTEM can achieve atomic resolution on a variety of samples, and can provide crystallographic information on your (nano-)crystals. The EDX spectrometer can be combined with scanning electron microscopy to obtain a spatial map of the elements in your sample.

The HRTEM is located on campus Tech Lane Ghent Science Park, building 46, Tech Lane Ghent Science Park, 9052 Gent.