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Researcher
Pascal De Langhe
Profile
Projects
Publications
Activities
Awards & Distinctions
11
Results
1999
Photovia technology: Some important aspects for reliability
Suixin Zhang
Johan De Baets
André Van Calster
Dorina Corlatan
Pascal De Langhe
Koenraad Allaert
P1
Conference
1999
1996
Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems.
Kurt Haelvoet
Steven Criel
F DOBBELAERE
Luc Martens
Pascal De Langhe
R DE SMEDT
C1
Conference
1996
Radiated emission of PCB tracks.
Pascal De Langhe
Femke Olyslager
Ann Franchois
Daniël De Zutter
Koenraad Allaert
C1
Conference
1996
1995
Samenwerking industrie-universiteit helpt de EMC-materie te ontmaskeren
Koenraad Allaert
M Cumps
Pascal De Langhe
R De Smedt
Ann Franchois
Daniël De Zutter
Luc Martens
Femke Olyslager
A4
Journal Article
in
HET INGENIEURSBLAD
1995
1994
Design rules for an experimental setup using an open-ended coaxial probe based on theoretical modelling
Pascal De Langhe
Luc Martens
Daniël De Zutter
A1
Journal Article
in
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
1994
Hoogfrequent karakterisatie van PCB- en absorbermaterialen en van connectorafschermingen
Pascal De Langhe
Daniël De Zutter
L. Martens
Dissertation
1994
Theoretical-analysis of an open-ended coaxial probe on a cylinder of finite thickness.
Pascal De Langhe
Luc Martens
Daniël De Zutter
A1
Journal Article
in
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS
1994
1993
Measurement of low permittivity materials based on a spectral domain analysis for the open-ended coaxial probe.
Pascal De Langhe
Krist Blomme
Luc Martens
Daniël De Zutter
A1
Journal Article
in
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
1993
Mixed component integration in MCM-L technologyCARTS Europe '99: 13th European Passive Components Symposium, 18-22 October 1999, Lisbon, Portugal, pp. 113-118.
S O'REILLY
M DUFFY
SC MATHUNA
An Madou
Luc Martens
Dorina Corlatan
E RAEDSCHELDERS
Pascal De Langhe
E LANGKABEL
C1
Conference
Theoretical and experimental quantitative characterization of the near-fields of printed circuit board interconnection structures.
Steven Criel
Kurt Haelvoet
Luc Martens
Daniël De Zutter
Ann Franchois
R DE SMEDT
Pascal De Langhe
C1
Conference
Transfer impedance measurements on the shielding of a multi-pins board-to-board connector 1994 IEEE Intern. Symposium on Electromagnetic compatibility, August 1994, Chicago, USA, pp. 453-455.
Pascal De Langhe
Luc Martens
Daniël De Zutter
D MORLION
C1
Conference