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Researcher
Niels Lambrecht
Profile
Projects
Publications
Activities
Awards & Distinctions
8
Results
2019
Machine learning based error detection in transient susceptibility tests
Roberto Medico
Niels Lambrecht
Hugo Pues
Dries Vande Ginste
Dirk Deschrijver
Tom Dhaene
Domenico Spina
A1
Journal Article
in
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
2019
2018
A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test
Niels Lambrecht
H. Pues
Daniël De Zutter
Dries Vande Ginste
A1
Journal Article
in
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
2018
Modeling of complex EMC test setups for the assessment of the transient behavior of automotive integrated circuits
Niels Lambrecht
Dries Vande Ginste
Daniël De Zutter
Dissertation
2018
2017
Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust
Niels Lambrecht
Daniël De Zutter
Dries Vande Ginste
H. Pues
C1
Conference
2017
Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices
Niels Lambrecht
H Pues
Daniël De Zutter
Dries Vande Ginste
A1
Journal Article
in
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
2017
Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test
Niels Lambrecht
Daniël De Zutter
Dries Vande Ginste
H. Pues
C1
Conference
2017
Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test
Niels Lambrecht
Daniël De Zutter
Dries Vande Ginste
Hugo Pues
P1
Conference
2017
2016
Efficient circuit modeling technique for the analysis and optimization of ISO 10605 field coupled Electrostatic Discharge (ESD) robustness of nonlinear devices
Niels Lambrecht
C. Gazda
H. Pues
Daniël De Zutter
Dries Vande Ginste
A1
Journal Article
in
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
2016