Research Explorer

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Researcher

Niels Lambrecht

Awards & Distinctions

8 Results

2019

Machine learning based error detection in transient susceptibility tests

Roberto MedicoNiels LambrechtHugo PuesDries Vande GinsteDirk DeschrijverTom DhaeneDomenico Spina

A1 Journal Article in IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY

2018

A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test

Niels LambrechtH. PuesDaniël De ZutterDries Vande Ginste

A1 Journal Article in IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY

Modeling of complex EMC test setups for the assessment of the transient behavior of automotive integrated circuits

Niels LambrechtDries Vande GinsteDaniël De Zutter

2017

Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust

Niels LambrechtDaniël De ZutterDries Vande GinsteH. Pues

Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices

Niels LambrechtH PuesDaniël De ZutterDries Vande Ginste

A1 Journal Article in IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY

Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test

Niels LambrechtDaniël De ZutterDries Vande GinsteH. Pues

Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test

Niels LambrechtDaniël De ZutterDries Vande GinsteHugo Pues

2016

Efficient circuit modeling technique for the analysis and optimization of ISO 10605 field coupled Electrostatic Discharge (ESD) robustness of nonlinear devices

Niels LambrechtC. GazdaH. PuesDaniël De ZutterDries Vande Ginste

A1 Journal Article in IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY