Research Explorer

Your browser does not support JavaScript or JavaScript is not enabled. Without JavaScript some functions of this webapplication may be disabled or cause error messages. To enable JavaScript, please consult the manual of your browser or contact your system administrator.

Researcher

Guy Huylebroeck

Publications & Research Data

Awards & Distinctions

9 Results

1992

DLTS of nickel impurities in germanium

Guy HuylebroeckPaul ClauwsEddy SimoenJoost Vennik

A1 Journal Article in SOLID STATE COMMUNICATIONS

1991

DLTS of high-resistivity Si

Eddy SimoenCor ClaeysGuy HuylebroeckPaul Clauws

1990

On the determination of the defect parameters of repulsive centers by deep level transient spectroscopy

Guy HuylebroeckPaul ClauwsJoost Vennik

A1 Journal Article in SOLID-STATE ELECTRONICS

1989

DLTS of silver in germanium : evidence for an amphoteric impurity

Guy HuylebroeckPaul ClauwsEddy SimoenEls RotsaertJoost Vennik

A1 Journal Article in SEMICONDUCTOR SCIENCE AND TECHNOLOGY

DLTS of the third acceptor level of substitutional copper in germanium

Paul ClauwsGuy HuylebroeckEddy SimoenPeter VermaerckeF. De SmetJoost Vennik

A1 Journal Article in SEMICONDUCTOR SCIENCE AND TECHNOLOGY

DLTS van transitiemetalen in germanium

Guy HuylebroeckJ. Vennik

1987

DLTS of gold impurities in germanium

Eddy SimoenPaul ClauwsGuy HuylebroeckJoost Vennik

A1 Journal Article in SEMICONDUCTOR SCIENCE AND TECHNOLOGY

1986

Correlation between deep-level parameters and energy resolution of p-type high purity Ge γ-detectors

Eddy SimoenPaul ClauwsGuy HuylebroeckJoost VennikL. Van GoethemM. Van SandeL. De LaetH.J. Guislain

A1 Journal Article in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT

1983

New methods for the characterization of electrically active defects in semiconductors : PTIS and DLTS

Paul ClauwsJan BroeckxEddy SimoenM. LamonGuy HuylebroeckJoost Vennik

A2 Journal Article in PHYSICALIA MAGAZINE